Software-Based Self-Test (SBST)

For mission-critical applications, e.g., avionics and automotive electronics, software-based self-test is a promising solution to complement the mainstream  scan-based manufacturing/on-line testing. SBST has the following advantages:

• ▪ Inherently on-line and functional
• ▪ No extra design-for-test (DfT) circuitry
• ▪ Flexible test scheduling.

SBST test program generation is essentially a sequential test generation problem. The goal of our SBST research is to provide a fully-automated SBST solution.

Automatic Test Pattern Generation (ATPG)

The quest for more powerful ATPG is ever-lasting.

With the advance of IC fabrication technology, ATPG has to deal with not only more devices but also more defect mechanisms. To make things worse, it is not uncommon that ATPG has to take into account test power consumption, test compression, and diagnosability.

To address this issue, our main interest is parallel ATPG with attention to the preservation of determinism. In addition, we also investigate to improve basic ATPG components, including testability analysis and learning.